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Title: Efficient protection of the pipeline core for safety-critical processor-based systems
Authors: Touloupis, E.
Flint, James A.
Chouliaras, V.A.
Ward, D.D.
Issue Date: 2005
Publisher: © IEEE
Citation: TOULOUPIS, E. .....et al., 2005. Efficient protection of the pipeline core for safety-critical processor-based systems. IN: IEEE Workshop on Signal Processing Systems Design and Implementation, Athens, Nov 2nd-4th, pp. 188 - 192
Abstract: The increasing number of safety-critical commercial applications has generated a need for components with high levels of reliability. As CMOS process sizes continue to shrink, the reliability of ICs is negatively affected since they become more sensitive to transient faults. New circuit designs must take this fact into consideration, and incorporate adequate protection against the effects of transient faults. This paper presents a novel method for protecting the pipelined execution unit of an embedded processor. It is based on a self-configured architecture with hybrid redundancy that can mask single and multiple errors, which can occur on storage elements due to transient or permanent faults. This concept can be easily applied to any processing architecture of this nature with a high safety integrity level. Results from error-injection experiments are also reported that show that this design can maintain a non-interrupted and failure-free operation under single and double errors with a probability that exceeds 99.4%.
Description: This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Published
DOI: 10.1109/SIPS.2005.1579862
URI: https://dspace.lboro.ac.uk/2134/6131
ISBN: 0780393333
ISSN: 1520-6130
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)

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