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|Title: ||Alternative color filter array layouts for digital photography|
|Authors: ||Gorokhovskiy, K.|
Flint, James A.
|Keywords: ||Digital photography|
Image color analysis
|Issue Date: ||2006|
|Publisher: ||© IEEE|
|Citation: ||GOROKHOVSKIY, K., FLINT, J.A. and DATTA, S., 2006. Alternative color filter array layouts for digital photography. IN: Malcovati, P. and Baschirotto, A. (eds.). 2nd Conference
on Ph.D. Research in Microelectronics and Electronics, Otranto (Lecce), Italy, June 12-15, 2006, Proceedings, pp. 265-268.|
|Abstract: ||The performance of digital cameras depends not only on the accuracy of methods of restoration of missed color samples (demosaicking) for a given color filter array, but also from spatial configuration of color sensors in the color filter array (CFA) itself. This paper considers three different color filter array (CFA) patterns; the established (2 by 2) Bayer pattern, the 3 by 2 (6-sample) and the 3 by 3 diagonal Bayer CFA. One difficulty in comparing the different schemes is the influence of the demosaicking algorithm on the result. In order to remove this dependence we propose three methods of comparison. They are: (a) measuring widowed averages of colors on large areas (b) visual comparison of interference between regular patterns of images and CFA, and (c) utilization of one layer neural networks to build demosaicking algorithm for selected color filter arrays. A substantial image database comprising 1338 images has been used to experimentally validate the different patterns.|
|Description: ||This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Appears in Collections:||Conference Papers and Contributions (Mechanical, Electrical and Manufacturing Engineering)|
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