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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/8192

Title: Seasonal performance of a-Si single- and multijunction modules in two locations
Authors: Gottschalg, Ralph
del Cueto, J.A.
Betts, Thomas R.
Infield, David
Issue Date: 2005
Publisher: © IEEE
Citation: GOTTSCHALG, R. ... et al, 2005. Seasonal performance of a-Si single- and multijunction modules in two locations. IN: Conference Record of the 31st IEEE Photovoltaic Specialists Conference 2005, Lake Buena Vista, USA, 3rd-7th January, pp. 1484-1487.
Abstract: Module performance data collected at two sites are analyzed in order to identify the respective magnitudes of seasonal annealing and degradation in comparison to spectral effects. It is demonstrated in this paper that at one site (Loughborough, UK) the spectrum dominates and very little seasonal annealing is observed. In contrast, at the other site (Golden, US), half of the seasonal variation can be attributed to spectral changes while the other half must be attributed to thermal annealing of defects. Differences between multi-junction categories are investigated and it is shown that singlejunction devices exhibit a greater seasonal annealing than multi-junctions, while the latter tend to be more influenced by spectral effects.
Description: This conference paper [© IEEE] is also available at: http://dx.doi.org/10.1109/PVSC.2005.1488423. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Published
DOI: 10.1109/PVSC.2005.1488423
URI: https://dspace.lboro.ac.uk/2134/8192
Publisher Link: http://dx.doi.org/10.1109/PVSC.2005.1488423
ISBN: 0780387074
ISSN: 0160-8371
Appears in Collections:Conference Papers and Contributions (CREST)
Conference Papers and Presentations (Mechanical, Electrical and Manufacturing Engineering)

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