+44 (0)1509 263171
Please use this identifier to cite or link to this item:
|Title: ||Accuracy of energy prediction methodologies|
|Authors: ||Williams, Sheryl R.|
Betts, Thomas R.
de Moor, H.
van der Borg, N.
Guerin de Montgareuil, Antoine
|Issue Date: ||2006|
|Publisher: ||© IEEE|
|Citation: ||WILLIAMS, S.R. ... et al, 2006. Accuracy of energy prediction methodologies. IN: Conference Record of the 4th IEEE World Conference on Photovoltaic Energy Conversion 2006, Vol.2, Hawaii, USA, 7th-12th May, pp. 2206-2209.|
|Abstract: ||In the current market, the specific annual
energy yield (kWh/kWp) of a PV system is gaining in
importance due to its direct link to the financial returns
for possible investors who typically demand an
accuracy of 5% in this prediction. This paper focuses
on the energy prediction of photovoltaic modules
themselves, as there have been significant advances
achieved with module technologies which affect the
device physics in a way that might force the revisiting
of device modelling.
The paper reports the results of a round robin
based evaluation of European modelling
methodologies. The results indicate that the error in
predicting energy yield for the same module at
different locations was within 5% for most of the
methodologies. However, this error increased
significantly if the nominal nameplate rating is used in
the characterization stage. For similar modules at the
same location the uncertainties were much larger due
to module-module variations.|
|Description: ||This conference paper [© IEEE] is also available at: http://dx.doi.org/10.1109/WCPEC.2006.279946. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Publisher Link: ||http://dx.doi.org/10.1109/WCPEC.2006.279946|
|Appears in Collections:||Conference Papers and Contributions (Mechanical, Electrical and Manufacturing Engineering)|
Conference Papers and Contributions (CREST)
Files associated with this item:
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.