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Title: Analysis of key performance parameter extraction from current voltage measurements of photovoltaic devices
Authors: Qasem, Hassan
Betts, Thomas R.
Sara, Ira D.
Bliss, Martin
Zhu, Jiang
Gottschalg, Ralph
Issue Date: 2011
Publisher: © IEEE
Citation: QASEM, H. ... et al, 2011. Analysis of key performance parameter extraction from current voltage measurements of photovoltaic devices. IN: Proceedings of 37th IEEE Photovoltaic Specialist Conference (PVSC), Seattle, USA, 19th-24th June.
Series/Report no.: Proceeding number;644
Abstract: The accuracy of the characterisation of photovoltaic devices may be affected by the method of extraction of the performance parameters. This paper investigates potential uncertainties in extracted short circuit current (Isc), open circuit voltage (Voc) and maximum power (Pmpp) from current-voltage (I-V) data of a photovoltaic (PV) device. Different interpolation methods are compared. Linear interpolation, straight line regression and polynomial regression methods are compared in different scenarios in which the curve point density and point selection for extraction are varied. The comparison shows that regression approaches can produce more accurate results when appropriate curve point density and point selection are selected. When attempting to extract Isc. Voc and Pmpp from noisy or irregular I-V data, linear interpolation is less robust than regression because of the irregular point distribution on the I-V curve.
Description: This conference paper [© IEEE] is also available at: http://www.ieee.org/conferences_events/. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Version: Accepted for publication
URI: https://dspace.lboro.ac.uk/2134/8462
Publisher Link: http://www.ieee-pvsc.org/PVSC37/
Appears in Collections:Conference Papers and Presentations (Mechanical, Electrical and Manufacturing Engineering)
Conference Papers and Contributions (CREST)

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