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Please use this identifier to cite or link to this item: https://dspace.lboro.ac.uk/2134/9217

Title: Influence of spectral irradiance measurements on accuracy of performance ratio estimation in large scale PV systems
Authors: Krawczynski, Michal
Strobel, Matthias
Hibberd, Christopher J.
Betts, Thomas R.
Gottschalg, Ralph
Keywords: Spectral response
Solar radiation
Performance
Issue Date: 2010
Publisher: © WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG
Citation: KRAWCZYNSKI, M. ... et al, 2010. Influence of spectral irradiance measurements on accuracy of performance ratio estimation in large scale PV systems. IN Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition (EUPVSEC) and 5th World Conference on Photovoltaic Energy Conversion (WCPEC 5), Valencia, pp. 4710 - 4714.
Abstract: Understanding the quality of irradiance measurements is an essential part of PV monitoring. For precise estimation of solar radiation all of its properties must be considered. There are two different ways to describe irradiance – broadband and spectral. Broadband irradiance measurements are by far the most commonly applied technique and can be undertaken by the use of pyranometers or calibrated reference cells. Broadband measurements give integrated power over a specified bandwidth. Spectral irradiance describes not only the integrated energy of the sunlight, but also its distribution by wavelength. PV modules are strictly wavelength selective devices. Their spectral sensitivity depends mostly on the cell material technology. Spectral effects can be observed at their most extreme for thin-film a-Si modules. Knowing the accurate intensity and spectral distribution of the sunlight may have a significant influence on accurate prediction of the available energy for different types of PV device.
Description: This is a conference paper.
Version: Accepted for publication
DOI: 10.4229/25thEUPVSEC2010-4BV.1.92
URI: https://dspace.lboro.ac.uk/2134/9217
Publisher Link: http://www.eupvsec-proceedings.com/
ISBN: 3936338264
Appears in Collections:Conference Papers and Contributions (Electronic, Electrical and Systems Engineering)
Conference Papers and Contributions (CREST)

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